Reliability is as much a key to success in the microelectronicsindustry as is performance. Not only must a product perform asdesired, it must also work for an extended period of time withoutfail, ...

An innovative measurement technique is providing new insights on electromigration, a leading cause of premature death of microcircuits. Until recently, this phenomenon, which causes fatal shorts and ...

Continuous downward scaling is challenging electromigration (EM) signoff using traditional EM checking approaches. The size reduction of metal line cross sections results in higher current densities, ...

The shift towards the 28nm node and beyond has put the spotlight back on the interconnect in semiconductor manufacturing. In chip scaling, the big problem in the interconnect is resistance-capacitance ...

The power current requirements of integrated circuits are rapidly rising, as discussed in Chapter 1. The current density in on-chip power and ground lines can reach several hundred thousands of ...

Electromigration (EM) is a phenomenon that has been well researched and understood by the design community. At mature nodes, its impact on digital integrated circuits, particularly signal ...