TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, ...

This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.

The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

Over the last decade, recent electron microscope advancements have created new ways in which to push the boundaries of what is possible with regards to resolution in transmission electron microscopes ...

The University of Oxford’s Department of Materials has introduced a custom-built £3 million Transmission Electron Microscope (TEM), marking a significant advancement in microscopy. The JEOL ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

In recent years, STEM-in-SEM (the industry acronym for Scanning Transmission Electron Microscopy in an SEM) has increased in popularity for a number of experts. This technique has drawn attention from ...

The joint development team of Professor Shibata (the University of Tokyo), JEOL Ltd. and Monash University succeeded in directly observing an atomic magnetic field, the origin of magnets (magnetic ...

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