This circuit uses pulsed current to check transistor hFE on an oscilloscope. The circuit creates the biasing conditions specified by the transistor’s manufacturer.

Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...

Beat the Test challenge rooms in Transistor with our detailed guide full of tips and helpful hints!

PCB - In Circuit Testing PCB - In Circuit Testing In Circuit Testing for Medium-High Volume PCBs: A Cost-Effective Method PCBs are widely recognized as being the most cost-effective to test in-circuit ...

Explains the principles of transistor switching circuits, highlighting their role in electronic computers. It contrasts transistors with vacuum tubes, emphasizing that transistors function as ...

The chip, dubbed the random access nanotube test chip, or RANT, contains a network of silicon wires and switches that form a circuit. Researchers then proceeded to grow carbon nanotubes directly onto ...

Beat the Test challenge rooms in Transistor with our detailed guide full of tips and helpful hints!