Electronic Design

Hybrid Power Architecture Delivers GaN, IGBT Advantages to EV Apps

Cambridge GaN Devices’s hybrid architecture for power modules combines gallium-nitride and IGBT devices to give EV designers an efficient, affordable solution for drivetrains and accessories. CGD's ...
The New York Times

Democrats Need Jon Tester to Defy the Odds Again

Control of the Senate could turn on Montana. Good evening! Tonight, my colleague Mike Baker, who covers the West, has a dispatch from the state that might have the country’s most important Senate race ...
IEEE

Fatigue Crack Networks in Die-Attach Layers of IGBT Modules Under a Power Cycling Test

Abstract: The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network ...
IEEE

Design and test of a high power IGBT non-destructive tester

Abstract: The study proposes the primary design and transient analysis of an IGBT non-destructive tester. The tester is designed to test IGBTs at voltage and current ratings less than 3.3kV 2.4kA. Due ...